Associate Prof. Yuan LI

Address: Room 414, Hetian Building

Research Group Homepage:

Associate Prof. Dr. Li received his bachelor degree from Zhejiang University in 2008, and Master degree from Eindhoven University of Technology (the Netherlands) in 2010. He obtained a Ph.D. degree from National University of Singapore (Singapore) in 2015. From 2016 to 2019, he is a postdoctoral fellow in Whitesides research group at Harvard University (USA). From 2019, he joined the Chemistry Department at Tsinghua University, employed as an associate professor. His research interest includes molecular electronics, nanofabrication, synthesis, self-assembly, mechanism of tunneling.

Selected publications:

1.Yuan, L.#; Wang L.#; Garrigues, A. R.#; Jiang, L.; Annadata, H. V.; del Barco, E.; Nijhuis, C. A. Transition from Direct to Inverted Charge Transport Marcus Regions in Molecular, Nat. Nanotechnol. 2018, 13, 322-329.
2.Chen, X. P.#; Roemer, M.#; Yuan, L.; Wang T.; Jiang, L.; Wang, L. J.; Nijhuis, C. A. Molecular Diodes with Rectification Ratios Exceeding 105 Driven by Electrostatic Interactions, Nat. Nanotechnol. 2017, 12, 797-803.
3.Yuan, L.#; Franco, C.#; Crivillers, N.#; Mas-Torrent, M.; Cao, L.; Rovira, C.; Veciana, J.; Nijhuis, C. A. Chemical Control over the Energy Level Alignment in a Two-Terminal Junction, Nat. Commun. 2016, Article number: 12066.
4.Yuan, L.; Breuer, R.; Jiang, L.; Annadata, H. V.; Schmittel, M.; Nijhuis, C. A.  A Molecular Diode with a Statistically Robust Rectification Ratio of Three Orders of Magnitude, Nano. Lett. 2015, 15, 5506-5512.
5.Yuan, L.; Nerngchamnong, N.; Cao, L.; Hamoudi, H.; Del Barco, E.; Roemer, M.; Sriramula, R.; Thompson, D.; Nijhuis, C. A. Controlling the Direction of Rectification in a Molecular Diode, Nat. Commun. 2015, 6, Article number: 6324.
6.Yuan L.; Jiang, L.; Thompson, D.; Nijhuis, C. A. On the Remarkable Role of Surface Topography of the Bottom-Electrodes in Blocking Leakage Currents in Molecular Diodes, J. Am. Chem. Soc. 2014, 136, 6554-6557.
7.Yuan, L.; Jiang, L.; Zhang, B.; Nijhuis, C. A.  Dependency of the Tunneling Decay Coefficient in Molecular Tunneling Junctions on the Topography of the Bottom Electrodes, Angew. Chem. Int. Ed. 2014, 53, 3377-3381.
8.Nerngchanmnong, N.#; Yuan, L.#; Qi, D. C.; Jiang, L.; Thompson, D.; Nijhuis, C. A. The Role of van der Waals Forces in the Performance of Molecular Diodes, Nat. Nanotechnol. 2013, 8, 113-118.